Chip Multilayer Ceramic Capacitors for General Purpose GRM0335C1H3R0BA01_(0201,C0G(EIA),3pF,DC 50 V) _:Packaging Code Reference Sheet ■ Scope This product specification is applied to Chip Multilayer Ceramic Capacitors used for General Electronic equipment. ■ MURATA Part No. System ■ Type ■ Rated Value (1)Size Code : 0201 (3)Temperature Characteristics :5C(Public STD Code :C0G(EIA)) ■ Package Product specifications in this catalog are as of Nov.23,2017,and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and !Cautions first. g Temp. coeff or Cap. Change (4)Rated Voltage (3)Temperature Characteristics Temp. Range Ref.Temp. Mounting Method 25 to 125 ℃ 3pF +/-0.1 pF -55 to 125 ℃ Reflow Operating Temp. Range (5)Nominal Capacitance (6)Capacitance Tolerance 25 ℃ (Ex.) 0.6 +/-0.03 0.3 +/-0.03 0.3 +/-0.03 D (8)Code Packaging Unit MURATA PART NO. Packaging GRM0335C1H3R0BA01_ (1)-1 L (1)-2 W (2) T e 0.1 to 0.2 Dimensions(mm) 0.2 min. W 15000 pcs./Reel 30000 pcs./Reel φ180mm Reel PAPER Tape W8P2 φ180mm Reel PAPER Tape W8P1 J φ330mm Reel PAPER Tape W8P2 50000 pcs./Reel 0+/-30 ppm/℃ DC 50 V (1)L/W Dimensions (2)T Dimensions (3)Temperature Characteristics (4)Rated Voltage (5)Nominal Capacitance (6)Capacitance Tolerance (8)Packaging Code (7)Murata’s Control Code GRM 03 3 5C 1H 3R0 B A01 D GRM0335C1H3R0BA01-01A ■ Specifications and Test Methods No. 1 Rated Voltage Shown in Rated value. The rated voltage is defined as the maximum voltage which may be applied continuously to the capacitor. When AC voltage is superimposed on DC voltage, VP-P or VO-P, whichever is larger, should be maintained within the rated voltage range. 2 Appearance No defects or abnormalities. Visual inspection. 3 Dimension Shown in Rated value. Using Measuring instrument of dimension. 4 Voltage Proof No defects or abnormalities. Measurement Point : Between the terminations Test Voltage : 300% of the rated voltage Applied Time : 1s to 5s Charge/Discharge Current : 50mA max. 5 Insulation Resistance(I.R.) More than 10000MΩ Measurement Temperature: Room Temperature Measurement Point : Between the terminations Measurement Voltage : Rated Voltage Charging Time : 2min Charge/Discharge Current : 50mA max. 6 Capacitance Shown in Rated value. Measurement Temperature: Room Temperature Measurement Frequency : 1.0+/-0.1MHz Measurement Voltage : 0.5 to 5.0Vrms 7 Q or Dissipation Factor (D.F.) Q≧400+20C C:Nominal Capacitance(pF) Measurement Temperature : Room Temperature Measurement Frequency : 1.0+/-0.1MHz Measurement Voltage : 0.5 to 5.0Vrms 8 Capacitance No bias Nominal value of the temperature coefficient is shown in Rated value. The capacitance change should be measured after 5 minutes at each specified temperature stage. Temperature Characteristics Capacitance Drift:Within +/-0.2% or +/-0.05pF (Whichever is larger) Measurement Voltage : Less than 1.0Vrms (Refer to the individual data sheet) Item Specification Test Method (Ref. Standard:JIS C 5101, IEC60384) Capacitance value as a reference is the value in "*" marked step. But, the Capacitance Change under Reference Temperature is shown in Table A. The capacitance drift is calculated by dividing the differences between the maximum and minimum measured values in the step 1,3 and 5 by the capacitance value in step 3. Step Temperature(℃) Time (min) 1 Min.Operating Temp. +0/-3 30+/-3 2 Reference Temp. 2 to 3 3 Max.Operating Temp. +3/-0 30+/-3 4 Reference Temp. 2 to 3 Step Temperature(°C) Applying Voltage 1 Reference Temp. +/-2 2 Min. Operating Temp. +/-3 3 * Reference Temp. +/-2 4 Max. Operating Temp. ±3 5 Reference Temp. +/-2 No bias GRM0335C1H3R0BA01-01A No. 9 Adhesive Strength of No removal of the terminations or other defect should occur. Solder the capacitor on the test substrate shown in Fig.3. Termination Applied Force : 2N Holding Time : 10+/-1ｓ Applied Direction : In parallel with the test substrate and vertical with the capacitor side 10 Vibration Appearance No defects or abnormalities. Solder the capacitor on the test substrate shown in Fig.3. Kind of Vibration : A simple harmonic motion 10Hz to 55Hz to 10Hz Capacitance Within the specified initial value. Vibration Time : 1min Total Amplitude : 1.5mm Q or D.F. Within the specified initial value. This motion should be applied for a period of 2hours in each 3 mutually perpendicular directions(total of 6hours). 11 Substrate Appearance No defects or abnormalities. Solder the capacitor on the test substrate shown in Fig.1. Bending Test Pressurization Method : Shown in Fig.2. Capacitance Within +/-5% or +/-0.5pF (Whichever is larger) Flexure : 1mm Change Holding Time : 5+/-1s Soldering Method : Reflow soldering 12 Solderability 95% of the terminations is to be soldered evenly and continuously. Test Method : Solder bath method Flux : Solution of rosin ethanol 25(mass)% Preheat : 80℃ to 120℃、10s to 30s Solder : Sn-3.0Ag-0.5Cu(Lead Free Solder) Test Temp. : 245+/-5℃ Test Time : 2+/-0.5s 13 Resistance Appearance No defects or abnormalities. Test Method : Solder bath method to Soldering Solder : Sn-3.0Ag-0.5Cu(Lead Free Solder) Heat Capacitance Within +/-2.5% or +/-0.25pF (Whichever is larger) Solder Temp. : 270+/-5℃ Change Test Time : 10+/-0.5s Q or D.F. Within the specified initial value. Preheat Temp. : 120℃ to 150℃ Preheat Time : 1min I.R. Within the specified initial value. Voltage No defects. Post-treatment : Let sit for 24+/-2hours at room temperature, then measure. Proof 14 Temperature Appearance No defects or abnormalities. Solder the capacitor on the test substrate shown in Fig.3. Sudden Cycles : 5 cycles Change Capacitance Within +/-2.5% or +/-0.25pF (Whichever is larger) Change Q or D.F. Within the specified initial value. I.R. Within the specified initial value. Voltage No defects. Proof Post-treatment : Let sit for 24+/-2hours at room temperature, then measure. Item Specification Test Method (Ref. Standard:JIS C 5101, IEC60384) Step Temperature(℃) Time (min) 1 Min.Operating Temp. +0/-3 30+/-3 2 Reference Temp. 2 to 3 3 Max.Operating Temp. +3/-0 30+/-3 4 Reference Temp. 2 to 3 Step Temperature(°C) Applying Voltage 1 Reference Temp. +/-2 2 Min. Operating Temp. +/-3 3 * Reference Temp. +/-2 4 Max. Operating Temp. ±3 5 Reference Temp. +/-2 No bias GRM0335C1H3R0BA01-01A No. 15 High Appearance No defects or abnormalities. Solder the capacitor on the test substrate shown in Fig.3. Temperature Test Temperature : 40+/-2℃ High Humidity Capacitance Within +/-7.5% or +/-0.75pF (Whichever is larger) Test Humidity : 90%RH to 95%RH (Steady) Change Test Time : 500+/-12h Q or D.F. Q≧100+10C/3 C:Nominal Capacitance(pF) Test Voltage : Rated Voltage Charge/Discharge Current : 50mA max. I.R. More than 500MΩ or 25Ω･F (Whichever is smaller) Post-treatment : Let sit for 24+/-2hours at room temperature, then measure. 16 Durability Appearance No defects or abnormalities. Solder the capacitor on the test substrate shown in Fig.3. Test Temperature : Maximum Operating Temperature+/-3℃ Capacitance Within +/-3% or +/-0.3pF (Whichever is larger) Test Time : 1000+/-12h Change Test Voltage : 200% of the rated voltage Q or D.F. Q≧200+10C C:Nominal Capacitance(pF) Charge/Discharge Current : 50mA max. I.R. More than 1000MΩ or 50Ω･F (Whichever is smaller) Post-treatment : Let sit for 24+/-2hours at room temperature, then measure. Item Specification Test Method (Ref. Standard:JIS C 5101, IEC60384) Step Temperature(℃) Time (min) 1 Min.Operating Temp. +0/-3 30+/-3 2 Reference Temp. 2 to 3 3 Max.Operating Temp. +3/-0 30+/-3 4 Reference Temp. 2 to 3 Table A Capacitance Change between at Reference Temp. and at each Temp. (%) Char. 5C 0.58 -0.24 0.4 -0.17 0.25 Max. Min. Max. Min. Max. -0.11

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