NANOCALC-2000-UV-VIS-NIR

Wavelength:

250-1100 nm

Thickness:

10 nm-70 um

Light source:

Deuterium and Tungsten Halogen

NANOCALC-2000-UV-VIS

Wavelength:

250-850 nm

Thickness:

10 nm-20 um

Light source:

Deuterium and Tungsten Halogen

NANOCALC-2000-VIS-NIR

Wavelength:

400-1100 nm

Thickness:

20 nm-10 um (optional 1 um-250 um)

Light source:

Tungsten Halogen

NANOCALC-2000-VIS

Wavelength:

400-850 nm

Thickness:

50 nm-20 um

Light source:

Tungsten Halogen

NANOCALC-2000-NIR

Wavelength:

650-1100 nm

Thickness:

70 nm-70 um

Light source:

Tungsten Halogen

NANOCALC-2000-NIR-HR

Wavelength:

650-1100 nm

Thickness:

70 nm-70 um

Light source:

Tungsten Halogen

NANOCALC-2000-512-NIR

Wavelength:

900-1700 nm

Thickness:

50 nm-200 um

Light source:

High-power Tungsten Halogen

Angle of incidence:

90°

Number of layers:

3 or fewer

Reference measurement needed:

Yes (bare substrate)

Transparent materials:

Yes

Transmission mode:

Yes

Rough materials:

Yes

Measurement speed:

100 milliseconds to 1 second

On-line possibilities:

Yes

Mechanical tolerance (height):

With new reference or collimation (74-UV)

Mechanical tolerance (angle):

Yes, with new reference

Microspot option:

Yes, with microscope

Vision option:

Yes, with microscope

Mapping option:

6" and 12" XYZ mapping tables

Vacuum possibilities:

Yes